PowerTester
test early test often
M4 is excited to announce the availability of high-power transient thermal characterization and active power cycling testing services for power diode, MOSFET, and IGBT products. A non-destructive assessment is performed while the device remains mounted, powered, and cooled in the same way it would be in end-use applications. This provides package-level, layer-by-layer thermal transient characterization and defect identification of semiconductor devices in the form of a structure function. If power dissipation and thermal performance of your high-wattage semiconductor product is of critical concern, then structure function data can provide actionable design and process insights in a matter of hours.
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