Skip to content
  • Engineering Software
  • Design
    • Mechanical Components
    • Composite Design
  • Analysis
    • Aeroelastic Analysis
    • Structural Analysis
    • CFD/Flow
  • Optimization
    • Multi Disciplinary Optimization
    • Weight Reduction Topology Optimization
    • Optimization Composites
  • Manufacturing
    • Composites Manufacturing
    • Metallic Fabrication
    • Fixtures & Tooling
  • Testing
    • Test Execution & Support
    • Material Testing & Allowables Development
    • Test Correlation
    • Power Semiconductor Testing
  • PLM Capabilities
    • PLM Software
    • PLM Services
  • About Us
    • Community
      • Our Team
      • Our Clients
      • Careers
      • Academic & Community Outreach
    • Contact
      • Technical Support
    • Insights
      • In the News
      • Press Release
      • Publications
      • Technical Blog
Menu
  • Engineering Software
  • Design
    • Mechanical Components
    • Composite Design
  • Analysis
    • Aeroelastic Analysis
    • Structural Analysis
    • CFD/Flow
  • Optimization
    • Multi Disciplinary Optimization
    • Weight Reduction Topology Optimization
    • Optimization Composites
  • Manufacturing
    • Composites Manufacturing
    • Metallic Fabrication
    • Fixtures & Tooling
  • Testing
    • Test Execution & Support
    • Material Testing & Allowables Development
    • Test Correlation
    • Power Semiconductor Testing
  • PLM Capabilities
    • PLM Software
    • PLM Services
  • About Us
    • Community
      • Our Team
      • Our Clients
      • Careers
      • Academic & Community Outreach
    • Contact
      • Technical Support
    • Insights
      • In the News
      • Press Release
      • Publications
      • Technical Blog
20year_mockup_6_600res_2000px
  • Software
  • Design
    • Mechanical Design
    • Composite Design
  • Analysis
    • Aeroelastic Analysis
    • Structural Analysis
    • CFD/Flow
  • Optimization
    • Multi Disciplinary Optimization
    • Weight Reduction Topology Optimization
    • Composites (Optimization)
  • Manufacturing
    • Composites Manufacturing
    • Metallic Fabrication
    • Fixtures & Tooling
  • Testing
    • Test Execution & Support
    • Material Testing & Allowables Development
    • Test Correlation
    • Power Semiconductor Testing
  • PLM
    • PLM Software
    • PLM Services
  • About Us
    • Insights
      • In the News
      • Press Release
      • Publications
      • Technical Blog
    • Community
      • Our Team
      • Our Clients
      • Careers
      • Academic & Community Outreach
    • Contact
      • Technical Support
Menu
  • Software
  • Design
    • Mechanical Design
    • Composite Design
  • Analysis
    • Aeroelastic Analysis
    • Structural Analysis
    • CFD/Flow
  • Optimization
    • Multi Disciplinary Optimization
    • Weight Reduction Topology Optimization
    • Composites (Optimization)
  • Manufacturing
    • Composites Manufacturing
    • Metallic Fabrication
    • Fixtures & Tooling
  • Testing
    • Test Execution & Support
    • Material Testing & Allowables Development
    • Test Correlation
    • Power Semiconductor Testing
  • PLM
    • PLM Software
    • PLM Services
  • About Us
    • Insights
      • In the News
      • Press Release
      • Publications
      • Technical Blog
    • Community
      • Our Team
      • Our Clients
      • Careers
      • Academic & Community Outreach
    • Contact
      • Technical Support

semiconductor characterization

  1. Home>
  2. semiconductor characterization
Read more about the article Testing of High-Power IGBT, Power Transistor, Power Diode, and MOSFET Semiconductor Devices

Testing of High-Power IGBT, Power Transistor, Power Diode, and MOSFET Semiconductor Devices

  • Post author:Manderlee Baker
  • Post published:August 12, 2020
  • Post category:Technical Blog

There's an art to semiconductor development and testing thanks to the competing constraints imposed by time, money, precision, repeatability, and test coverage.  Teams that are able to leverage accelerated lifetime…

Continue ReadingTesting of High-Power IGBT, Power Transistor, Power Diode, and MOSFET Semiconductor Devices

Recent Posts

  • Thermal-Structural Analysis of PCB in Simcenter 3D
  • Shear Moment Diagram of a Blended Wing Body using pyNastran
  • July 2021 Newsletter
  • April 2021 Newsletter
  • Q-criterion for Vortex Visualization

Categories

  • Conference Publications
  • In the news
  • Journal Articles
  • Newsletters
  • Press Release
  • Publications
  • Technical Blog
Schedule a meeting
m4logo_2020_transparent_HQ
Twitter Facebook-f Linkedin-in Youtube
  • (562) 981-7797
Contact Us

© All rights reserved 2020
Design by M4 Engineering, Inc.