Testing of High-Power IGBT, Power Transistor, Power Diode, and MOSFET Semiconductor Devices

There's an art to semiconductor development and testing thanks to the competing constraints imposed by time, money, precision, repeatability, and test coverage.  Teams that are able to leverage accelerated lifetime…

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Aeroelastic Optimization of Wing Structure Using Curvilinear Spars and Ribs (SpaRibs) (2020)

Authors Joe Robinson, Steven Doyle, Grant Ogawa,  Myles Baker, Shuvodeep De, Mohamed Jrad, and Rakesh Kapania Abstract Conventional aircraft wing structures consist of skins over a network of substructures and…

Continue ReadingAeroelastic Optimization of Wing Structure Using Curvilinear Spars and Ribs (SpaRibs) (2020)

Qualifications of Margins and Mixed Uncertainties Using Evidence Theory and Stochastic Expansions (2015)

Authors Harsheel Shah, Serhat Hosder, Tyler Winter Abstract The objective of this paper is to implement Dempster–Shafer Theory of Evidence (DSTE) in the presence of mixed (aleatory and multiple sources…

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